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in-situ observation of electrically-active device operation using electrical probing TEM holder
 작성자 : Master
Date : 2014-10-28 18:22  |  Hit : 1,313  
  • A study on operation and failure mechanism of electronic device
  • Measurement of electrical properties of individual nano-size semiconductor materials (nanowire, nanorod, etc.)
 
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서울시 관악구 관악로1 서울대학교 31동 411호
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In-situ Electron Microscopy Laboratory
31-411 Dept. of Materials Science and Engineering
Seoul National University
Gwanak-ro1 Gwanak-gu Seoul, Republic of Korea
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