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in-situ observation of electrically-active device operation using electrical probing TEM holder
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작성자 :
Master
Date : 2014-10-28 18:22 | Hit : 2,018
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- A study on operation and failure mechanism of electronic device
- Measurement of electrical properties of individual nano-size semiconductor materials (nanowire, nanorod, etc.)
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서울시 관악구 관악로1 서울대학교 31동 411호
실시간관찰전자현미경 연구실
Tel : 02-878-5010 | Fax : 02-878-5010
COPYRIGHT 2014. ALL RIGHT RESERVED |
In-situ Electron Microscopy Laboratory
31-411 Dept. of Materials Science and Engineering
Seoul National University
Gwanak-ro1 Gwanak-gu Seoul, Republic of Korea |
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