|
HOME > Research > In-situ Electron microscopy |
in-situ observation of electrically-active device operation using electrical probing TEM holder
|
|
ÀÛ¼ºÀÚ :
Master
Date : 2014-10-28 18:22 | Hit : 1,992
|
- A study on operation and failure mechanism of electronic device
- Measurement of electrical properties of individual nano-size semiconductor materials (nanowire, nanorod, etc.)
|
|
|
|
|
|
|
|
|
¼¿ï½Ã °ü¾Ç±¸ °ü¾Ç·Î1 ¼¿ï´ëÇб³ 31µ¿ 411È£ ½Ç½Ã°£°üÂûÀüÀÚÇö¹Ì°æ ¿¬±¸½Ç Tel : 02-878-5010 | Fax : 02-878-5010
COPYRIGHT 2014. ALL RIGHT RESERVED |
In-situ Electron Microscopy Laboratory 31-411 Dept. of Materials Science and Engineering Seoul National University Gwanak-ro1 Gwanak-gu Seoul, Republic of Korea |
|
|