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in-situ observation of copper atom behavior using current injection TEM holder
 ÀÛ¼ºÀÚ : Master
Date : 2014-10-28 12:50  |  Hit : 1,866  

  • A study on the copper atom migration and hillock formation
  • Failure mechanism observation of copper line in electrical device
 
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In-situ Electron Microscopy Laboratory
31-411 Dept. of Materials Science and Engineering
Seoul National University
Gwanak-ro1 Gwanak-gu Seoul, Republic of Korea
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