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ÀÛ¼ºÀÏ : 15-01-20 17:40
2004
 ±Û¾´ÀÌ : Master
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Growth kinetics of MgB2 layer and interfacial MgO layer during ex situ annealing of amorphous boron film, H. M. Kim, S. S. Yim, K. B. Kim, S. H. Moon, Y. W. Kim, and D. H. Kang,  J Mater Res 19 (10), 3081 (2004).

 
   
 

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In-situ Electron Microscopy Laboratory
31-411 Dept. of Materials Science and Engineering
Seoul National University
Gwanak-ro1 Gwanak-gu Seoul, Republic of Korea
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